Join Us for this Free Webinar Hosted by Mettler Toledo:
TOC and Dissolved O2 in Microelectronics
Increase Wafer and IC Yield Friday October 28th 10:00 AM EST
October 2022 MARIETTA, GA
Topics covered will include:
The key analytical measurements required to increase yield of semiconductor manufacturing and the role they play in wafer processing.
Why TOC control prevents damage to IC circuits.
How dissolved oxygen can result in etching and loss of control of gate oxide thickness.
Recommendations for reclaim/reuse/recycle.
Presenter(s):Jon Cannon
Duration:
45 minute (s)
10/28/2022 10:00 AM [ EST ]
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